April 7, 2010

1 Min Read
Presenting In-Line Particle Sizing for High-Shear Granulation

At the Advances in Process Analytics and Control Technology 2010 Conference, April 28-30, 2010, Manchester, UK, Malvern Instruments process systems specialist Jarvis Jeejing will give a presentation of in-line particle size analysis for high-shear granulation processes. He will introduce the technique of particle velocimetry for in-line particle size measurement, focusing on its application to the control and optimization of high-shear granulation processes within the pharmaceutical industry.

Jeejing’s presentation will form part of a session on Thursday, April 29 dedicated to industrial applications of process analysis. Malvern will also participate in the associated trade exhibition.

Particle velocimetry, exemplified in the Parsum inline particle probe (IPP70) from Malvern Instruments, is a technique that is suitable for measuring particles in the size range 50 to 6000 microns, travelling at velocities of between 0.01 and 50 m/s. This makes it ideal for monitoring processes such as granulation, spray drying, fluidized bed and particle size reduction.

The importance of granulation in pharmaceutical manufacturing is well established, where it is used widely to improve the flow properties and consistency of tableting blends, as well as for other properties. High shear (or wet) granulation delivers high throughput and dense, uniform, dust-free granules, but its optimization can be challenging. Continuous monitoring offers a valuable approach. For more information, visit www.malvern.com/process.

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