Malvern Panalytical Launches Compact X-Ray Diffractometer

Malvern Panalytical launches a new version of its Aeris compact X-ray diffractometer (XRD). This new version contains capabilities previously seen in much larger systems.

Building on the family of compact Aeris XRD systems that provide high-quality data from polycrystalline materials at competitive speeds, the new Aeris model is designed for use in all environments. Specifically, grazing-incidence XRD (GIXRD) will enable the examination of thin films and coatings, while transmission measurements will provide more accurate data that are not affected by sample preparation artefacts.

The Aeris XRD’s straightforward operational interface simplifies XRD measurements for the user. The performance of the Aeris is similar to floor standing systems. It does not require any external supplies and infrastructure and is cost effective. Furthermore, the Aeris can be used in a regulated environment with OmniTrust software.

Even with expanding capability range, operators will still be able to switch easily between different applications, enabling them to concentrate on their research rather than on setting and aligning the system. With the new Aeris, researchers can obtain detailed, accurate data more easily and affordably, opening possibilities for smaller companies in the pharmaceutical and coatings industries, as well as educational institutions, to contribute to scientific research and process development.

“I’m very proud that we’re launching our new Aeris – a model that continually raises the bar for powder XRD,” said Wilijan Vissers, Aeris product manager. “By providing the data quality of a floor-standing system in a compact instrument, the new Aeris will enable a wider range of our customers to carry out in-depth materials analysis and optimize their processes – helping push the scientific frontier even further forward.”

Malvern Panalytical, UK +44 (0) 1684 892456 www.malvernpanalytical.com