Organizers of the two-day Particle Summit, which takes place near Boston, October 20-21, 2010 at The Charles Hotel, Cambridge, MA, have announced two additional speakers for the event:

Dr. Joerg Bolze from analytical X-ray company PANalytical will discuss ‘Nanoparticle Size Distribution Determination By Small-Angle X-Ray Scattering on a Multi-Purpose X-Ray Diffractometer Platform’. He will include a short introduction to the SAXS technique together with application examples illustrating its potential and limitations for liquid nanoparticle dispersions, nano-powders, and nanocomposites.

Alon Vaisman from Malvern Instruments will present ‘Particle Sizing - a Proven Technology for Process Control’, in which he will describe how implementing on-line laser diffraction and real-time process control can maximize efficiency and eliminate out-of-spec production.

These additions to the program bring the number of speakers over the two days to 17, who between them will cover a wide range of particle characterization topics and technologies.

The event, which is sponsored by Malvern Instruments, also features an optional pre-conference workshop on October 19 where participants can learn or refresh their knowledge of the basic principles of particle characterization.

For a full program and registration information, visit www.particlesummit.org.