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Malvern’s Rawle Talks TLAs in Plenary Lecture at Particulate Systems Analysis Conference

August 20, 2014

Dr. Alan Rawle, applications manager for Malvern Instruments, will give a plenary lecture at Particulate Systems Analysis (PSA) 2014, organized by the Royal Society of Chemistry’s Particle Characterization Group. The event takes place September 15-17 at the Manchester Conference Centre, Manchester UK, and this year incorporates the UK Particle Technology Forum and Fine Bubble Symposium.

The title of Rawle’s lecture is “TLAs and the 4Qs in relation to elucidation of particle sizing issues.” TLA stands for “Three-Letter Acronyms.”
“The prime objective is entertainment with an educational experience as a sideline,” said Rawle. “I’ve used TLAs over the years as an aide memoire in particle size analysis. For instance, I’ll be introducing important particle size concepts, such as when one would want to use a particle counter - concentration, contamination, cleanliness, the 3Cs - as opposed to a particle size analyzer. Another example is nanotechnology particle properties, which can be thought through with the 4Ss - size, shape, surface, solubility.”
Rawle is an expert in many areas of particle characterization and is the recent recipient of a Distinguished Service Award presented by the chairman of the ASTM Committee E56 on Nanotechnology in recognition of his contribution to the Committee’s success and its development of a range of ASTM standards, as well as his continued mentoring and guidance of others.
In addition to Rawle’s lecture, other members of the Malvern team will be making presentations as part of the conference sessions. On Monday, September 15, Luke Green, applications specialist, will discuss “Morphological analysis of particle suspensions with automated imaging”, and on Wednesday, September 17, Cathryn Langley, application development scientist, will present “Particle Characterization in Forensic Analysis”. On Tuesday, September 16, “Developments in Characterization of Suspensions by Nanoparticle Tracking Analysis (NTA)” will be the topic of a presentation given by Bob Carr, founder of NanoSight, which is now part of Malvern Instruments.
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