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Powder/Bulk Solids

The Source for Dry Processing and Bulk Handling Technology

Particle Analysis

September 15, 2006

Image AnalyzerThe Alpaga 500 Nano is an image analyzer that is used to provide high-quality images with true resolution of less than 500 nanometers. Equipped with the VDD 270, a vacuum disperser device, preparation of slide glass for analysis can be performed in a few seconds. The Alpaga 500 then utilizes an advanced image analysis program to further determine particle size distributions based on up to 16 different measurement parameters. The most commonly employed parameters are sieve-size, width, height, equivalent diameter, roundness, roughness, elongation, convexity, reactivity, crystallinity, hole detection, volume, area, perimeter, shape factor and specific surface. Particle size range is 0.5–2,500 microns.Particle Sizing Systems, Santa Barbara, CA 805-968-1497 www.pssnicomp.comParticle Size AnalyzerThe DJD Laser Particle Size Analyzer features patented DJD measurement technology for performance in both wet and dry dispersion mode. The analyzer includes an improved sampling system, making it easier for the operator to load samples. It also features a mass flow regulator that disperses dry samples regardless of the sample volume. Analyzers seamlessly integrate wet and dry dispersion in the same instrument without the need for hardware changes. The user can immediately switch between wet and dry dispersion modes with the click of a mouse. The DJD is fully ISO 13320 compliant and has a measurement range from 0.04 to 2,500 microns. CILAS Particle Size, Madison, WI 608-274-7719 www.particle-size.usParticle Size AnalyzerThe new-generation SediGraph III 5120 particle size analyzer combines the proven SediGraph analytical technique with advanced instrumentation features to provide excellent repeatability, accuracy and reproducibility in the size range of 300mm to 0.1mm. In addition, complete particle accountability assures that the entire introduced sample is accounted for. The SediGraph III measures mass by X-ray absorption and particle size by sedimentation so no modeling is required. A versatile and interactive reporting system provides a wide range of custom data presentation options and now includes grain size in Phi units and particle settling velocity. Statistical Process Control (SPC) reporting and regression analyses are also available.Micromeritics Instrument Corp., Norcross, GA 770-662-3688 www.micromeritics.com